| Microtrac > The S3500 & SDC Analyser |
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The Microtrac S3500 series is the industry's first modular upgradeable designed particle size analyzer. What this revolutionary modular design now provides - FOR THE FIRST TIME - is the ability to expand and upgrade your particle size analyzer without replacing the entire system. So now, as your needs grow and change, your analyzer can grow and change with you faster and more economically.
Particle Size
Range : 0.02 to 2816 microns
(ALL IN ONE MEASUREMENT WITHOUT CHANGING A LENS OR CELL)
Wet or Dry Measurements
Modular System allows future
system upgrades in a matter of minutes.
Patented Tri-laser technology provides accurate, reliable, and repeatable test
results in seconds.
Rapid changeover from wet to dry measurements takes a few minutes.
The highest resolution.
More powerful optical technology greatly extends the range of measurement.
User friendly equipment and software.
Designed for long-term operation with minimal maintenance.
Outstanding technical and customer support.
Worldwide distribution and service network.
CONFIGURATION
S3500
Series
| Configuration | Wet Range | Dry Range |
Validation Available |
Multi Laser System | Wet-Dry System Available | Upgradeable |
| Enhanced | 0.02 - 2816 um | .025 - 2816 um | Y | Y | Y |
Y |
| Extended | 0.02 - 1500 um | 0,25 - 2816 um | Y | Y | Y | Y |
| Standard | 0.25 - 1500 um | 0.25 - 1500 um | Y | Y | Y | Y |
| Basic | 0.7 - 1000 um | 0.7 - 1500 um | Y | Y | Y | N |
| Legacy Analyzers available upon request: | ||
| Additional Particle Size Analyzers | ||
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X100/SRA FAMILY |
SRA150 | X100 |
| Range | 0.7-700 Microns | 0.04 -704 Microns |
| Phase | Wet or Dry | Wet or Dry |
| Measurement Technique | Laser diffraction analysis | Laser diffraction analysis using unified scatter technique |
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SRA 150 |
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| Range | 0.7-700 Microns |
| Phase | Wet or Dry Measurements |
| Measurement Technique | Laser diffraction analysis |
| Optics | Single laser diode and forward photo detector array |
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X-100 |
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| Range | 0.04-704 Microns |
| Phase | Wet or Dry Measurements |
| Measurement Technique | Laser diffraction analysis using Unified Scatter Technique |
| Optics | One primary (on-axis) laser diode and two secondary (off-axis) laser diodes with one forward and one high-angle photo detector array |
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